Progress in Non-Destructive Testing and Evaluation of SiC/SiC Composites

LIU Songping; LIU Feifei; ZHANG Qingle; LI Zhiying

doi:10.16080/j.issn1671-833x.2020.19.024

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Progress in Non-Destructive Testing and Evaluation of SiC/SiC Composites

更新时间：2025-10-30

- Progress in Non-Destructive Testing and Evaluation of SiC/SiC Composites
- Aeronautical Manufacturing Technology Vol. 63, Issue 19, Pages: 24-30(2020)
- 作者机构：
  
  中国航空制造技术研究院复合材料技术中心,北京,101300
- 作者简介：
- 基金信息：
- DOI：10.16080/j.issn1671-833x.2020.19.024
  CLC：
- Published：2020
- 稿件说明：
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刘松平，刘菲菲，章清乐，李治应. SiCf/SiC复合材料无损检测与评估技术进展[J]. 航空制造技术, 2020, 63(19): 24-30.

LIU Songping, LIU Feifei, ZHANG Qingle, LI Zhiying. Progress in Non-Destructive Testing and Evaluation of SiCf /SiC Composites. Aeronautical Manufacturing Technology, 2020, 63(19): 24-30.
刘松平，刘菲菲，章清乐，李治应. SiCf/SiC复合材料无损检测与评估技术进展[J]. 航空制造技术, 2020, 63(19): 24-30. DOI： 10.16080/j.issn1671-833x.2020.19.024.

LIU Songping, LIU Feifei, ZHANG Qingle, LI Zhiying. Progress in Non-Destructive Testing and Evaluation of SiCf /SiC Composites. Aeronautical Manufacturing Technology, 2020, 63(19): 24-30. DOI： 10.16080/j.issn1671-833x.2020.19.024.

摘要

随着 SiC

/SiC 复合材料在航空航天等领域高温热端部件中的推广应用，无损检测与评估尤为重要。由于这类复合材料具有非常特别的高温成型工艺和内部微结构及缺陷特征，需要研究采用专门的无损检测技术和缺陷评估方法。结合近年本领域的研究，分析了 SiC

/SiC 复合材料缺陷及其特征；回顾了 SiC

/SiC 复合材料无损检测与评估技术研究进展；总结了 SiC

/SiC 复合材料无损检测与评估面临的主要技术挑战；提出了 SiC

/SiC 复合材料无损检测与评估技术今后的主要发展趋势。目前的研究结果表明，高分辨率数字式 X– 射线成像和高分辨率超声 – 声发射检测或者非对称频率超声检测技术已成为 SiC

/SiC 复合材料非常重要的无损检测与评估方法，并已得到很好的实际检测应用效果。

Abstract

As silicon carbide fibre/silicon carbide ceramicmatrix composites (SiC

/SiC CMCs) have become widely used in high temperature hot-section components in aerospace and aero-engines

nondestructive testing and evaluation (NDT E) is particularly important. Due to the special high temperature manufacturing process

internal microstructure and defect characteristics of SiC

/SiC CMCs

it is difficult to realize reliable NDT E of SiC

/SiC CMCs by using existing detection techniques and defect evaluation methods. Based on the studies in this field in the recent years

the defects and characteristics of SiC

/SiC CMCs are analyzed. The research progress

in NDTE of SiC

/SiC CMCs is reviewed. The main technical challenges in NDTE of SiC

/SiC CMCs are presented. The future development tendency in NDT E of SiC

/SiC CMCs is given. At present

high-resolution digital X–ray imaging and high-resolution asymmetric-frequency ultrasonic detection techniques have become very important methods for the NDT E of SiC

/SiC CMCs

and good practical testing and applications have been obtained.

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