YU Houyun, SUN Jianyang, SUN Yihong, FU Pan, WEN Yaxin, SHAN Yingxuan, CHENG Yani. Detection of Rivet Unevenness Based on Structured Light and Binocular Vision[J]. Aeronautical Manufacturing Technology, 2024, 67(6): 34-41.
YU Houyun, SUN Jianyang, SUN Yihong, FU Pan, WEN Yaxin, SHAN Yingxuan, CHENG Yani. Detection of Rivet Unevenness Based on Structured Light and Binocular Vision[J]. Aeronautical Manufacturing Technology, 2024, 67(6): 34-41. DOI: 10.16080/j.issn1671-833x.2024.06.034.
Detection of Rivet Unevenness Based on Structured Light and Binocular Vision
In order to make up for the shortcomings of the traditional inspection methods of rivet unevenness in precision
efficiency and stability
a new inspection method is proposed based on structured light and binocular vision. First
the structured light is projected onto the surface by an industrial projector
and then the ojection image is captured by a binocular camera. Then the riveted area is extracted according to the edge
and the phase information of the area is calculated with the improved Gray code phase unwrapping. Feature points are matched based on phase information and point clouds are calculated according to the principle of disparity. Finally
the rivet unevenness is calculated by processing point data. The experimental results indicate that the absolute error is within ± 20 μm with repeatability less than 3 μm. The measurement time for a single rivet is approximately 2.2 s. Requirements for on-site measurement accuracy and efficiency can be met.