Programming and Simulation of Real Time Annealing Technology for Electron Beam Rapid Manufacturing System

WANG Hongze; LIU Fangjun; ZHANG Wei

doi:10.16080/j.issn1671–833x.2019.08.088

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Programming and Simulation of Real Time Annealing Technology for Electron Beam Rapid Manufacturing System

更新时间：2025-10-30

- Programming and Simulation of Real Time Annealing Technology for Electron Beam Rapid Manufacturing System
- Aeronautical Manufacturing Technology Vol. 62, Issue 8, Pages: 88-92(2019)
- 作者机构：
  
  北京航空航天大学机械工程及自动化学院,北京,100191
- 作者简介：
- 基金信息：
- DOI：10.16080/j.issn1671–833x.2019.08.088
  CLC：
- Published：2019
- 稿件说明：
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王宏泽，刘方军，张伟. 电子束熔丝成形随行退火系统设计及其仿真[J]. 航空制造技术, 2019, 62(8): 88-92.

WANG Hongze, LIU Fangjun, ZHANG Wei. Programming and Simulation of Real Time Annealing Technology for Electron Beam Rapid Manufacturing System. Aeronautical Manufacturing Technology, 2019, 62(8): 88-92.
王宏泽，刘方军，张伟. 电子束熔丝成形随行退火系统设计及其仿真[J]. 航空制造技术, 2019, 62(8): 88-92. DOI： 10.16080/j.issn1671–833x.2019.08.088.

WANG Hongze, LIU Fangjun, ZHANG Wei. Programming and Simulation of Real Time Annealing Technology for Electron Beam Rapid Manufacturing System. Aeronautical Manufacturing Technology, 2019, 62(8): 88-92. DOI： 10.16080/j.issn1671–833x.2019.08.088.

摘要

控制电子束偏转扫描对成形件进行局部实时退火热处理，可降低大型金属工件在电子束熔丝成形过程中产生的热应力，减少热应力累积而超过材料屈服强度产生的变形。采用工控机、波形发生卡、驱动电路及偏转扫描线圈搭建了电子束偏转扫描控制试验平台；使用LabVIEW开发了扫描控制程序，合成了X、Y两路输出波形，实现了矩形折线扫描及圆形偏置扫描。针对电子束扫描加热对成形件局部温度分布的影响，建立了随行退火扫描的有限元模型，分析了随行退火偏转扫描对100mm×100mm区域内温度场分布的影响。仿真结果表明，在束流30mA、束斑直径4mm、束斑搭接1mm的条件下，电子束以25m/s的速度扫描加热0.6323s，区域内温度差值由初始的94℃减小到11℃，有效改善了100mm×100mm 区域内温度场分布均匀程度。

Abstract

During the electron beam rapid manufacturing procedure of large metal work piece

the electron beam is used for scanning and heating in order to implement real-time annealing treatment which can eliminate the residual stress in the electron beam freedom fabrication process and reduce the deformation caused by the stress accumulation. In this paper

an electron beam high-frequency deflection scan control experiment platform

which consists of industrial computer

waveform generation card

drive circuit

and deflection scanning coil

is built to generate X

Y output waveform

do rectangular scan and circular offset scan. LabVIEW is used to develop the software interface. A real time annealing finite element model is built to analyze the influence of scanning on temperature distribution difference in a range of 100mm×100mm. The conclusion is the temperature difference in the area is reduced from 94℃ to 11℃ which improves the uniformity of the temperature distribution when the beam current is 30mA

beam spot radius is 4mm

beam spot overlap is 1mm

and using the electron beam to scan for 0.6323s with a speed of 25m/s.

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