1. 大连理工大学无损检测研究所,大连,116024
2. 上海复合材料科技有限公司,上海,201112
纸质出版:2025
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马志远,宋鑫民,张天旭,郝旭峰,林莉. 基于超声回波相位导数谱测量CFRP表面富树脂层厚度[J]. 航空制造技术, 2025, 68(9): 20-26.
MA Zhiyuan, SONG Xinmin, ZHANG Tianxu, HAO Xufeng, LIN Li. Thickness Measurement of Resin-Rich Layer Solidified on CFRP Based on Ultrasonic Echo Phase Derivative Spectrum[J]. Aeronautical Manufacturing Technology, 2025, 68(9): 20-26.
马志远,宋鑫民,张天旭,郝旭峰,林莉. 基于超声回波相位导数谱测量CFRP表面富树脂层厚度[J]. 航空制造技术, 2025, 68(9): 20-26. DOI: 10.16080/j.issn1671-833x.2025.09.020.
MA Zhiyuan, SONG Xinmin, ZHANG Tianxu, HAO Xufeng, LIN Li. Thickness Measurement of Resin-Rich Layer Solidified on CFRP Based on Ultrasonic Echo Phase Derivative Spectrum[J]. Aeronautical Manufacturing Technology, 2025, 68(9): 20-26. DOI: 10.16080/j.issn1671-833x.2025.09.020.
针对碳纤维增强复合材料(Carbon Fiber Reinforced Polymer,CFRP)表面富树脂层厚度薄、涂层与基体声学参数相近、叠层多界面等引起的传统超声测厚方法精度低的难题,提出了一种基于超声回波相位导数谱(Ultrasonic echo phase derivative spectrum,UEPDS)谐振频率测量CFRP表面富树脂层厚度的新方法。基于超声波在多层结构中的透射与反射规律,构建出耦合介质/ 涂层/ 基体三介质二界面结构的UEPDS,并辨识UEPDS 的谐振频率与涂层厚度之间的理论关系,以克服传统采用声压反射系数幅度谱或相位谱测厚时精度受基准波、信号初始相位等影响大的问题,结合标定声速,即可准确测定涂层厚度。试验使用超声C扫描系统结合标称频率25 MHz探头对厚度在数十~100 μm变化的富树脂层进行测厚,并与激光共聚焦显微镜观测厚度进行对比验证。结果表明,25 MHz探头可有效实现厚度≥40.7 μm的富树脂层测厚,超声测厚云图与金相观测厚度之间绝对误差≤5.1 μm,相对误差8.0%。研究发现影响测厚准确率的主要因素为富树脂层/ 基体界面存在的起伏状编织间隙残留树脂。
Aiming at the problems of low accuracy of traditional ultrasonic thickness measurement methods caused by thin resin-rich layer on the surface of carbon fiber reinforced polymer (CFRP)
similar acoustic parameters between the coating and the matrix
and multiple interfaces
a new method based on ultrasonic echo phase derivative spectrum (UEPDS) is proposed to measure the thickness of resin-rich layer on CFRP surface. Based on the multiple reflection rules of ultrasonic waves in multi-layer structures
the UEPDS of coupled medium/coating/substrate three-medium two-interface structure is constructed
and the theoretical relationship between the resonant frequency of UEPDS and coating thickness is identified
so as to overcome the problem that the accuracy of thickness measurement by the traditional sound pressure reflection coefficient amplitude spectrum or phase spectrum is greatly affected by the reference wave and the initial phase of the signal. Combined with calibrated sound velocity
the coating thickness can be accurately determined. The thickness of the resin-rich layer varying from tens to hundreds of microns was measured by an ultrasonic C–scanning system combined with a nominal frequency 25 MHz probe
and the thickness was compared with that observed by laser confocal microscopy. The results show that the 25 MHz probe can effectively measure the thickness of the rich resin layer with a thickness ≥40.7 μm
and the absolute error between the ultrasonic thickness cloud image and the metallographic observation thickness ≤5.1 μm
and the relative error 8.0%. The research shows that the main factor affecting the accuracy of thickness measurement is the presence of fluctuating braided gap residual resin at the resin-rich layer/matrix interface.
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